Sem/eds analysis company with MicroVision Laboratories, Inc. today? The profile of the flow of the solder at these bonds was documented using the SEM with backscatter imaging, which correlates brightness in the image with atomic density. Some voids were found in the solder as shown the SEM image. An EDS spectrum of the solder was acquired which showed that the solder was a tin/lead (80/20) solder. The EDS map clearly shows the copper wire and copper pad (red) with the tin lead solder (light blue) that appears to have flowed well and made a good bond between the copper elements. This map also shows the fiberglass bundles that add structural integrity to the board.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile. Explore extra info on Microvision labs eds mapping.
What if I want a service not listed in your services list? At MicroVision Labs the list of services which we provide to our clients is constantly growing. So if you don’t see what you are looking for give us a call or use the Contact Us tab. Also don’t forget to check our Additional Services Page to see if it might be listed there. Can you identify a contamination or unknown for us? Yes, we call that an Unknown Material ID and we routinely work on that kind of project. We have a number of individual tests designed to classify unknown materials. When combined with our extensive suite of equipment, these tests allow us to identify virtually any material. Give us a call and talk to one of our knowledgeable staff for more information.
Translucent or transparent coatings on metallic or semi-conductor substrates are very difficult to image due to their reflective nature. Nomarski/DIC imaging is an effective method for accentuating differences in thickness, density or the optical index in these cases. This analysis enhances and highlights subtle features with brilliant color gradients and captures them with a high resolution digital imaging system. Let us bring out your sample’s hidden features. Explore even more info on https://microvisionlabs.com/.